Corelis – JTAG HW controllers & HW test modules

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Zvika Almog



JTAG Boundary-Scan Controllers

Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2.0, PCI, PCI Express, PXI/cPCI, Ethernet, VME, and VXI. Most of Corelis’ boundary-scan controllers operate up to 80MHz sustained TCK frequency. This wide choice of platforms allows greater flexibility to meet specific price and performance criteria for a given application while maintaining complete software transportability across all hardware platforms.

Controller Selection Matrix 

The table below lists both current and legacy JTAG controllers offered by Corelis.   Click on the controller model below to find out more about each of our JTAG Boundary-Scan Controllers.  A brief description of each controller follows. For complete information on the controllers, please refer to the detailed datasheets.

JTAG Boundary-Scan Controllers




TCK Speed 
USB 2.0



100 MHz USB-1149.1-CFM
USB 2.0



100 MHz USB-1149.1-1E
USB 2.0



100 MHz USB-11491-4E_Controller
USB 2.0 & Ethernet



80 MHz NetUSB
USB 2.0 & Ethernet 



70 MHz NetUSB11491SE


4,8 or 32 (*)

80 MHz PCI-1149-Turbo
PCI Express


4,8 or 32 (*)

80 MHz PCIe-11491_Controller
USB 2.0

QuadTap CFM

450 MHz QuadTapCFM


4,8 or 32 (*)

80 MHz CPXI-1149.1-in-a-chassis



JTAG Boundary-Scan Controllers for High-Volume Production Systems

Hardware Based Parallel Operations

Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.  





JTAG Boundary-Scan I/O Modules

The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.

The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.

Product Selection Matrix

A listing of available SCANIO™ modules is provided in the following table:




Digital I/O controller with 300 Pins

ScanIO-300LV (1)

ScanDIMMsInterconnect testing for DIMM socketsScanDIMM-all




The ScanIO-300LV digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo™ or NetUSB-1149.1™) into a powerful digital interconnect and functional tester. It uses boundary-scan compatible ASICs to add control and visibility to connectors, traces, and logic that can not be tested using traditional scan techniques. The ScanIO-300LV, combined with a boundary-scan controller, operates as a traditional “bed of nails” test system except access to the stimulus-and response I/Os is achieved via boundary-scan, and the size and the cost of the system are significantly smaller than traditional testers.

The ScanIO-300LV module provides a total of 300 fully bidirectional test channels with virtually unlimited memory depth per pin. Each line is independently controlled and can be individually configured as an input or output. During testing, the programming and control of the test channels is automatically performed by the ScanExpress™ tools without any user intervention. The voltage level of the I/O and JTAG interfaces is programmable from 1.25V to 3.3V and supports either single ended or low voltage differential (LVDS) signaling.

Multiple ScanIO-300LV modules can be cascaded in series providing a sufficient number of pins for almost any digital test environment. By using single or multiple ScanIO-300LV modules, existing Automatic Test Pattern Generators (ATPGs) can be used to test non-scannable elements such as connectors, cables, and devices not incorporating boundary-scan. The ScanIO-300LV connects to the UUT inputs and outputs with standard flat-cables that can optionally be terminated with test probes.

Download specification of ScanIO-300LV




The ScanDIMM™ Digital Tester modules are an easy to use tool for interconnect testing of memory DIMM sockets.

Through the use of boundary-scan technology, the ScanDIMM Tester provides fully bi-directional test signals. A boundary-scan Test Access Port (TAP) connects to a host computer which provides virtually unlimited memory depth for testing each of the DIMM socket(s) pins.

DIMM sockets are often used for Double Data Rate (DDR) Synchronous Dynamic Random Access Memory (SDRAM) and other types of memories and the ScanDIMM offers an accurate and easy to use mechanical and electrical solution for testing connections to the DIMM socket(s).

Support is available for a number of DDR, DDR2 and DDR3 modules including 184-pin DIMM, 168-pin DIMM, 200-pin SODIMM, 204-pin DIMM, and 240-pin DIMM.

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For more information: Zvika Almog 054-2101400